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Author: I. Y. Kim


References



Reference
I. Y. Kim et al., “Development of the Transverse Beam Profile Monitors for the PAL-XFEL”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper TUPD16, pp. 452-454.
J. H. Han et al., “Beam Operation of the PAL-XFEL Injector Test Facility”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper WEB02, pp. 615-622.


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