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[n]	I. Y. Kim et al., “Development of the Transverse Beam Profile Monitors for the PAL-XFEL”, in Proc. IBIC'14, Monterey, CA, USA, Sep. 2014, paper TUPD16, pp. 452-454. 

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Paper Title: Development of the Transverse Beam Profile Monitors for the PAL-XFEL
Paper URL: https://jacow.org/IBIC2014/papers/TUPD16.pdf
Conference: 3rd Int. Beam Instrumentation Conf. (IBIC'14)
Paper ID: TUPD16
Location in proceedings: 452-454
Original Author String: I.Y. Kim, J.Y. Choi, H. Heo, H.-S. Kang, C. Kim, G. Mun, B.G. Oh, S.J. Park [PAL, Pohang, Kyungbuk, Republic of Korea]

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