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Author: F. Z. Chen


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Reference
N. Zhang, F. Z. Chen, and Y. M. Zhou, “Filling Pattern Measurement System Upgrade in SSRF”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 4791-4793.
F. Z. Chen et al., “SXFEL Linac BPM System Development and Performance Evaluation”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 4794-4796.
L. W. Lai, F. Z. Chen, Y. B. Leng, T. Wu, Y. B. Yan, and J. Chen, “Upgrade of Digital BPM Processor at DCLS and SXFEL”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 4807-4810.
F. Z. Chen, L. W. Lai, Y. B. Leng, N. Zhang, and Y. B. Yan, “Development of a Digital Beam Signal Processor Test System Based on MATLAB and SCPI”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 329-331.
L. W. Lai, F. Z. Chen, Y. B. Leng, Y. B. Yan, N. Zhang, and J. Chen, “Design and Performance of Digital BPM Processor for DCLS and SXFEL”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 338-340.
L. W. Lai et al., “BATCH APPLICATIONS OF DIGITAL BPM PROCESSORS FROM THE SINAP”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 658-660.
L. W. Lai et al., “The Application of Direct RF Sampling System on Cavity BPM Signal Processing”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 278-280.
F. Z. Chen, L. W. Lai, Y. B. Leng, and Y. B. Yan, “Design of A New Type of Beam Charge Monitor Based on Bunch by Bunch DAQ System”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 284-286.
L. W. Lai et al., “The Development and Applications of the Digital BPM Signal Processor at SINAP”, in Proc. 60th ICFA Advanced Beam Dynamics Workshop on Future Light Sources (FLS'18), Shanghai, China, Mar. 2018, pp. 43-45.
R. Jiang, F. Z. Chen, Z. C. Chen, and Y. B. Leng, “Identification of Faulty Beam Position Monitor Based Clustering by Fast Search and Find of Density Peaks”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 114-117.


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