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[n]	F. Z. Chen, L. W. Lai, Y. B. Leng, and Y. B. Yan, “Design of A New Type of Beam Charge Monitor Based on Bunch by Bunch DAQ System”, in Proc. IBIC'17, Grand Rapids, MI, USA, Aug. 2017, pp. 284-286. doi:10.18429/JACoW-IBIC2017-TUPWC03

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Paper Title: Design of A New Type of Beam Charge Monitor Based on Bunch by Bunch DAQ System
Paper URL: https://jacow.org/ibic2017/papers/TUPWC03.pdf
Conference: 6th Int. Beam Instrumentation Conf. (IBIC'17)
Paper ID: TUPWC03
Location in proceedings: 284-286
Original Author String: F.Z. Chen, L.W. Lai, Y.B. Leng [SSRF, Shanghai, People's Republic of China] Y.B. Yan [SINAP, Shanghai, People's Republic of China]

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