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H. J. You, W. I. Choo, and S. O. Jang, “Beam Profile Measurements with a Slit-Faraday Cup and a Wire Scanner for a Newly Developed 18 GHz Superconducting ECR Ion Source and its LEBT”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 113-117. |
