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[n]	H. J. You, W. I. Choo, and S. O. Jang, “Beam Profile Measurements with a Slit-Faraday Cup and a Wire Scanner for a Newly Developed 18 GHz Superconducting ECR Ion Source and its LEBT”, in Proc. IBIC'15, Melbourne, Australia, Sep. 2015, pp. 113-117. doi:10.18429/JACoW-IBIC2015-MOPB035

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Paper Title: Beam Profile Measurements with a Slit-Faraday Cup and a Wire Scanner for a Newly Developed 18 GHz Superconducting ECR Ion Source and its LEBT
Paper URL: https://jacow.org/IBIC2015/papers/MOPB035.pdf
Conference: 4th Int. Beam Instrumentation Conf. (IBIC'15)
Paper ID: MOPB035
Location in proceedings: 113-117
Original Author String: H.J. You, W.I. Choo, S.O. Jang [NFRI, Daejon, Republic of Korea]

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