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Author: I. A. Artyukov


References



Reference
G. Kube et al., “Micron-Scale Vertical Beam Size Measurements Based on Transition Radiation Imaging With a Schwarzschild Objective”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 327-329.
G. Kube et al., “Transverse Beam Profile Imaging of Few-Micrometer Beam Sizes Based on a Scintillator Screen”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 330-334.


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