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[n]	G. Kube et al., “Micron-Scale Vertical Beam Size Measurements Based on Transition Radiation Imaging With a Schwarzschild Objective”, in Proc. IBIC'15, Melbourne, Australia, Sep. 2015, pp. 327-329. doi:10.18429/JACoW-IBIC2015-TUPB011

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Paper Title: Micron-Scale Vertical Beam Size Measurements Based on Transition Radiation Imaging With a Schwarzschild Objective
Paper URL: https://jacow.org/IBIC2015/papers/TUPB011.pdf
Conference: 4th Int. Beam Instrumentation Conf. (IBIC'15)
Paper ID: TUPB011
Location in proceedings: 327-329
Original Author String: G. Kube, S. Bajt [DESY, Hamburg, Germany] I.A. Artyukov [LPI, Moscow, Russia] W. Lauth [IKP, Mainz, Germany] A. Potylitsyn, L.G. Sukhikh, A.V. Vukolov [TPU, Tomsk, Russia]

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