Reference Search
Search
Authors
Conferences
Favourites
Login
Register
Help
Author: T. Todd
References
Search
Search
Reference
J. R. Zagel
et al.
, “Operational Use of Ionization Profile Monitors at Fermilab”, in
Proc. 14th Beam Instrumentation Workshop (BIW'10)
, Santa Fe, NM, USA, May 2010, paper TUPSM009, pp. 111-115.
Back to the list