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Author: S. Borrelli


References



Reference
V. Schlott et al., “Commissioning Results and First Operational Experience with SwissFEL Diagnostics”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 104-108.
G. L. Orlandi et al., “First Experimental Results of the Commissioning of the SwissFEL Wire-Scanners”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 388-392.
E. Ferrari et al., “The ACHIP Experimental Chambers at PSI”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 336-339.
G. L. Orlandi et al., “FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 249-252.
G. L. Orlandi et al., “Wire-Scanners with Sub-Micrometer Resolution: Developments and Measurements”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 307-310.


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