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Author: D. Joyeux

	Reference
	F. Albert et al., “Niobium Surface Defect Induced by Strong Electric Field Probed by Soft X-Ray Laser Interferometry”, in Proc. 8th Int. Conf. RF Superconductivity (SRF'97), Padova, Italy, Oct. 1997, paper SRF97D09, pp. 873-880.

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