[n] F. Albert et al., “Niobium Surface Defect Induced by Strong Electric Field Probed by Soft X-Ray Laser Interferometry”, in Proc. SRF'97, Padova, Italy, Oct. 1997, paper SRF97D09, pp. 873-880.
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Paper Title: Niobium Surface Defect Induced by Strong Electric Field Probed by Soft X-Ray Laser Interferometry
Paper URL: https://jacow.org/SRF97/papers/SRF97D09.pdf
Conference: 8th Int. Conf. RF Superconductivity (SRF'97)
Paper ID: SRF97D09
Location in proceedings: 873-880
Original Author String: F. Albert, Ph. Zeitoun, D. Joyeux, Universit?® Paris Sud, Orsay; M. Boussoukaya, CEN-Saclay, Gif-Sur-Yvette; A. Carillon, S. Hubert, P. Jaegl?®, G. Jamelot, A. Klisnick, D. Phalippou, D. Ros, S. Sebban, Universit?® Paris Sud, Orsay; A. Zeitoun-Fakiris, CEN-Saclay, Gif-Sur-Yvette
