|
A. Navitski, E. Elsen, V. Myronenko, J. Schaffran, O. Turkot, and Y. Tamashevich, “Characterization of Surface Defects on EXFEL Series and ILC-Higrade Cavities”, in Proc. 17th Int. Conf. RF Superconductivity (SRF'15), Whistler, Canada, Sep. 2015, paper MOPB072, pp. 281-285. |
