[n] A. Navitski, E. Elsen, V. Myronenko, J. Schaffran, O. Turkot, and Y. Tamashevich, “Characterization of Surface Defects on EXFEL Series and ILC-Higrade Cavities”, in Proc. SRF'15, Whistler, Canada, Sep. 2015, paper MOPB072, pp. 281-285.
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Paper Title: Characterization of Surface Defects on EXFEL Series and ILC-Higrade Cavities
Paper URL: https://jacow.org/SRF2015/papers/MOPB072.pdf
Conference: 17th Int. Conf. RF Superconductivity (SRF'15)
Paper ID: MOPB072
Location in proceedings: 281-285
Original Author String: A. Navitski, E. Elsen, V. Myronenko, J. Schaffran, O. Turkot [DESY, Hamburg, Germany] Y. Tamashevich [University of Hamburg, Institut fuer Experimentalphysik, Hamburg, Germany]