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Author: O. Turkot


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Reference
A. Navitski, E. Elsen, V. Myronenko, J. Schaffran, O. Turkot, and Y. Tamashevich, “Characterization of Surface Defects on EXFEL Series and ILC-Higrade Cavities”, in Proc. 17th Int. Conf. RF Superconductivity (SRF'15), Whistler, Canada, Sep. 2015, paper MOPB072, pp. 281-285.
J. Malka et al., “Towards the implementation of a new European XFEL scientific data policy – challenges and chances”, in Proc. 20th International Conference on Accelerator and Large Experimental Control Systems (ICALEPCS'25), Chicago, IL, USA, Sep. 2025, pp. 398-403.
J. Malka et al., “Towards the implementation of a new European XFEL scientific data policy – challenges and chances.”, presented at the 20th International Conference on Accelerator and Large Experimental Control Systems (ICALEPCS'25), Chicago, IL, USA, Sep. 2025, paper TUPD107, unpublished.


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