|
M. Birri, D. Ferreira Sanchez, D. Grolimund, B. Meyer, and V. A. Samson, “Fast X-Ray Beam Intensity Stabilization for Absorption Spectroscopy and Spectromicroscopic Imaging”, in Proc. 10th Mechanical Engineering Design of Synchrotron Radiation Equipment and Instrumentation Conf. (MEDSI'18), Paris, France, Jun. 2018, pp. 343-345. |
|
M. Camarda et al., “Towards Full Silicon 4H-SiC Based X-Ray Beam Monitoring”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 665-668. |
