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Author: Y. Tokuda

	Reference
	Y. Tokuda and A. Usami, “Comparison of Neutron and 2 MeV Electron Damage in N-Type Silicon by Deep-Level Transient Spectroscopy”, in Proc. 9th Particle Accelerator Conf. (PAC'81), Washington D.C., USA, Mar. 1981, pp. 3564-3569.

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