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Author: O. Huerzeler


References



Reference
G. L. Orlandi et al., “FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 249-252.
G. L. Orlandi et al., “Wire-Scanners with Sub-Micrometer Resolution: Developments and Measurements”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 307-310.


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