|
C. Thiebaux et al., “Development of a Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. 22nd Int. Conf. on Cyclotrons and their Applications (Cyclotrons'19), Cape Town, South Africa, Sep. 2019, pp. 302-304. |
|
F. Poirier et al., “Beam Instrumentation, Challenging Tools for Demanding Projects ÔÇôÔÇô a Snapshot from the French Assigned Network”, in Proc. 15th International Conference on Heavy Ion Accelerator Technology (HIAT'22), Darmstadt, Germany, Jun.-Jul. 2022, pp. 57-62. |
|
C. Thiebaux et al., “First Results of PEPITES, A New Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. 11th Int. Beam Instrumentation Conference (IBIC'22), Kraków, Poland, Sep. 2022, pp. 80-83. |
