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Author: M. Verderi


References



Reference
C. Thiebaux et al., “Development of a Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. 22nd Int. Conf. on Cyclotrons and their Applications (Cyclotrons'19), Cape Town, South Africa, Sep. 2019, pp. 302-304.
F. Poirier et al., “Beam Instrumentation, Challenging Tools for Demanding Projects ÔÇôÔÇô a Snapshot from the French Assigned Network”, in Proc. 15th International Conference on Heavy Ion Accelerator Technology (HIAT'22), Darmstadt, Germany, Jun.-Jul. 2022, pp. 57-62.
C. Thiebaux et al., “First Results of PEPITES, A New Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. 11th Int. Beam Instrumentation Conference (IBIC'22), Kraków, Poland, Sep. 2022, pp. 80-83.


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