[n] C. Thiebaux et al., “Development of a Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. Cyclotrons'19, Cape Town, South Africa, Sep. 2019, pp. 302-304. doi:10.18429/JACoW-CYCLOTRONS2019-THB04
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Paper Title: Development of a Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams
Paper URL: https://jacow.org/cyclotrons2019/papers/THB04.pdf
Conference: 22nd Int. Conf. on Cyclotrons and their Applications (Cyclotrons'19)
Paper ID: THB04
Location in proceedings: 302-304
Original Author String: C. Thiebaux,G. Blain,B. Boyer,?ë. Delagnes,F. T. Gebreyohannes,Y. Geerebaert,O. Gevin,F. Haddad,C. Koumeir,F. Magniette,P. Manigot,N. Michel,F. Poirier,N. Servagent,T. Sounalet,M. Verderi