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Author: J. K. Penney


References



Reference
G. Andonian et al., “Fast and Robust Wire Scanners with Novel Materials for Profiling High Intensity Beams”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 436-438.
N. P. Norvell et al., “Gas Sheet Ionization Diagnostic for High Intensity Electron Beams”, in Proc. 12th Int. Particle Accelerator Conf. (IPAC'21), Campinas, Brazil, May 2021, pp. 489-491.


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