[n] G. Andonian et al., “Fast and Robust Wire Scanners with Novel Materials for Profiling High Intensity Beams”, in Proc. IBIC'19, Malmö, Sweden, Sep. 2019, pp. 436-438. doi:10.18429/JACoW-IBIC2019-TUPP043
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Paper Title: Fast and Robust Wire Scanners with Novel Materials for Profiling High Intensity Beams
Paper URL: https://jacow.org/ibic2019/papers/TUPP043.pdf
Conference: 8th Int. Beam Instrumentation Conf. (IBIC'19)
Paper ID: TUPP043
Location in proceedings: 436-438
Original Author String: G. Andonian,T. J. Campese,J. Gubeli,C. F. Huff,K. Jordan,A. Laurich,J. K. Penney,M. Ruelas,L. R. Scammell,R. R. Whitney,J. Yan