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N. Y. Na et al., “Design and Simulation of the High-Sensitivity Tune Measurement System Based on Diode Detection at HIAF”, presented at the 12th International Beam Instrumentation Conference (IBIC'23), Saskatoon, Canada # e.g. "Barcelona, Spain" or "San Francisco, CA, USA", Sep. 2023, paper WEP037, unpublished. |
