JaCoW Logo

Reference Search

Reference


For Word

[n]	N. Y. Na et al., “Design and Simulation of the High-Sensitivity Tune Measurement System Based on Diode Detection at HIAF”, presented at the IBIC'23, Saskatoon, Canada, Sep. 2023, paper WEP037, unpublished. 

For LaTeX

For BibTeX

Use Complete Form

Metadata

Paper Title: Design and Simulation of the High-Sensitivity Tune Measurement System Based on Diode Detection at HIAF
Conference: 12th International Beam Instrumentation Conference (IBIC'23)
Paper ID: WEP037
Original Author String: N. Y. Na,L. F. Lin,Y. Y. Wang,Y. L. Yang,Z. S. Zhang,Z. L. Zhao,G. Zhu

Associated Authors


Back to the list