[n] N. Y. Na et al., “Design and Simulation of the High-Sensitivity Tune Measurement System Based on Diode Detection at HIAF”, presented at the IBIC'23, Saskatoon, Canada, Sep. 2023, paper WEP037, unpublished.
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Paper Title: Design and Simulation of the High-Sensitivity Tune Measurement System Based on Diode Detection at HIAF
Conference: 12th International Beam Instrumentation Conference (IBIC'23)
Paper ID: WEP037
Original Author String: N. Y. Na,L. F. Lin,Y. Y. Wang,Y. L. Yang,Z. S. Zhang,Z. L. Zhao,G. Zhu