JaCoW Logo

Reference Search

Author: K. Avery


References



Reference
S. Biedron et al., “High Energy Heavy Ion Single Event Effects (HE HISEE): Planning for the future of microelectronics”, in Proc. 6th North American Particle Accelerator Conference (NAPAC'25), Sacramento, California, USA, Aug. 2025, pp. 1034-1037.


Back to the list