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32nd Int. Free Electron Laser Conf. (FEL'10)

Malmö, Sweden, Aug. 2010


References


Reference
Y. Li and J. Pfl??ger, “Investigation of the R56 of a Permanent Magnet Phase Shifter”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper THPC04, pp. 652-655.
Y. Otake, N. Hosoda, H. Maesaka, S. Matsubara, and T. Ohshima, “Development of a 770 Nm Pump-Probe Laser Directly Triggered by a 1540 nm Optical Master Oscillator at XFEL/SPring-8”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper THPA01, pp. 566-569.
Y. Socol, G. N. Kulipanov, A. N. Matveenko, O. A. Shevchenko, and N. Vinokurov, “13.5-nm Free-Electron Laser for EUV Lithography”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper TUPA28, pp. 250-253.
Y. T. Ding, Z. Huang, and S. A. Ocko, “Transverse-Coherence Properties of the FEL at the LCLS”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper MOPC16, pp. 151-154.
Y. Z. Chen et al., “Beam Diagnostic at SDUV-FEL”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper FROA3, pp. 711-713.
Yu. Shvyd, K.-J. Kim, R. R. Lindberg, D. Shu, H. Sinn, and S. Stoupin, “Feasibility of X-Ray Cavities for Hard X-Ray FEL Oscillators”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper FROA4, pp. 714-714.
Z. Huang, K. L. F. Bane, Y. T. Ding, and P. Emma, “A Single-Shot Method for Measuring Femtosecond Bunch Length in Linac-Based Free-Electron Lasers”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper WEOB3, pp. 353-353.
Z. Huang, Y. T. Ding, and J. Wu, “Three-Dimensional Analysis of Frequency-Chirped FELs”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper MOPB28, pp. 91-94.
Z. T. Zhao, “Progress in SDUV-FEL and Development of X-Ray FELs in Shanghai”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper MOOBI1, pp. 15-19.

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