1st Int. Beam Instrumentation Conf. (IBIC'12)
Tsukuba, Japan, Oct. 2012
References
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Reference
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S. D. Dhole et al., “270 degree Electron Beam Bending System using Two Sector Magnets for Therapy Application”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPA02, pp. 50-53. |
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S. D. Dhole, V. N. Bhoraskar, B. J. Patil, and N. S. Shinde, “An Electron Beam Profile Monitor for the Race-track Microtron”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPA04, pp. 54-56. |
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K. Thomsen and J. Devlaminck, “VIMOS, New Capabilities for an Optical Safety System”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPA06, pp. 57-59. |
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S. Hojo, A. Goto, T. Honma, K. Katagiri, A. Sugiura, and Y. Takahashi, “Development of a Phase Probe for the NIRS Small Cyclotron HM-18”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPA07, pp. 60-62. |
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F. Tamura et al., “Various Usages of Wall Current Monitors for Commissioning of RF Systems in J-PARC Synchrotrons”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPA08, pp. 63-65. |
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W. Vigano, B. Dehning, E. Effinger, G. G. Venturini, and C. Zamantzas, “Comparison of Three Different Concepts of High Dynamic Range and Dependability Optimised Current Measurement Digitisers for Beam Loss Systems”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPA09, pp. 66-70. |
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E. Griesmayer et al., “Diamond Detectors for LHC”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPA10, pp. 71-73. |
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G. G. Venturini, F. Anghinolfi, B. Dehning, and M. Kayal, “Characterization of a Wide Dynamic-range, Radiation-tolerant Charge-digitizer ASIC for Monitoring of Beam Losses”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPA12, pp. 74-78. |
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C. Bloomer and G. Rehm, “Real-time Calculation of Scale Factors of X-ray Beam Position Monitors during User Operation”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPA13, pp. 79-82. |
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C. S. Simon et al., “New Electronics Design for the European XFEL Re-entrant Cavity Monitor”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPA15, pp. 83-86. |
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