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5th Int. Beam Instrumentation Conf. (IBIC'16)

Barcelona, Spain, Sep. 2016

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	Reference
	T. A. Miller et al., “LEReC Instrumentation Design & Construction”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 417-421.
	S. Zorzetti et al., “A Wire-Based Methodology to Analyse the Nanometric Resolution of an RF Cavity BPM”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 63-66.
	S. Varnasseri et al., “Design of Stripline Beam Position Monitors for the ESS MEBT”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 620-622.
	S. V. Kuzikov, A. A. Vikharev, and S. P. Antipov, “Non-Invasive Bunch Length Diagnostics of Sub-Picosecond Beams”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 756-758.
	S. V. Kutsaev, A. Y. Murokh, M. Ruelas, H. L. To, and V. Goncharik, “Single-Shot THz Spectrometer for Bunch Length Measurements”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 782-784.
	S. Udrea et al., “Preparatory Work for a Fluorescence Based Profile Monitor for an Electron Lens”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 528-531.
	S. Seletskiy, T. A. Miller, and P. Thieberger, “Study of YAG Exposure Time for LEReC RF Diagnostic Beamline”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 233-235.
	S. Seletskiy et al., “Conceptual Design of LEReC Fast Machine Protection System”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 665-668.
	S. P. Jamison, E. W. Snedden, D. A. Walsh, M. J. Cliffe, D. M. Graham, and D. Lake, “A THz Driven Transverse Deflector for Femtosecond Longitudinal Profile Diagnostics”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 748-751.
	S. Montesano et al., “The Cherenkov Detector for Proton Flux Measurement (CpFM) in the UA9 Experiment”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 430-433.

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