6th Int. Beam Instrumentation Conf. (IBIC'17)
Grand Rapids, MI, USA, Aug. 2017
References
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Reference
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B. Keil et al., “First Beam Commissioning Experience With The SwissFEL Cavity BPM System”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 251-254. |
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M. Stadler, B. Keil, F. Marcellini, and G. Marinkovic, “The SwissFEL High-Q Undulator BPM System”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 255-258. |
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D. M. Treyer, B. Keil, W. Koprek, and D. Lipka, “Production Tests, Calibration, and Commissioning of Button BPMs for the European XFEL”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 259-262. |
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C. Boehme, I. Bekman, V. Kamerdzhiev, B. Lorentz, M. Simon, and C. Weidemann, “COSY Orbit Control Upgrade”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 263-266. |
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N. Eddy, B. J. Fellenz, P. S. Prieto, and S. Z. Zorzetti, “Transverse Damper Using Diodes for Slip Stacking in the Fermilab Recycler”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 267-269. |
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A. Arteche et al., “First Beam Tests at the CERN SPS of an Electro-Optic Beam Position Monitor for the HL-LHC”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 270-273. |
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C. Kim, J. H. Hong, H.-S. Kang, I. S. Ko, S. J. Lee, and D. C. Shin, “Stripline Beam Position Monitor for the PAL-XFEL”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 274-277. |
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L. W. Lai et al., “The Application of Direct RF Sampling System on Cavity BPM Signal Processing”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 278-280. |
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Y. M. Zhou, N. Zhang, L. W. Duan, and Y. B. Leng, “Three-Dimensional Bunch-by-Bunch Position Measurement at SSRF”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 281-283. |
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F. Z. Chen, L. W. Lai, Y. B. Leng, and Y. B. Yan, “Design of A New Type of Beam Charge Monitor Based on Bunch by Bunch DAQ System”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 284-286. |
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