6th Int. Beam Instrumentation Conf. (IBIC'17)
Grand Rapids, MI, USA, Aug. 2017
References
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Reference
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J. Pospisil, O. Bjorkqvist, A. Boccardi, and M. Wendt, “Digital Signal Processing Techniques to Monitor Bunch-by-Bunch Beam Positions in the LHC for Machine Protection Purposes”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 146-149. |
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A. Warner, D. Cathey, G. Cullen, J. Nelson, P. H. Kasper, and A. H. Lumpkin, “Development of the Electromagnetic Boom and MOP System (EMOP)”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 304-308. |
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A. Rost, T. Galatyuk, and J. Pietraszko, “Current Status of CVD Diamond Based Beam Detector Developments at the S-DALINAC”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 150-152. |
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C. Gerth, B. Beutner, O. Hensler, F. Obier, M. Scholz, and M. Yan, “Online Longitudinal Bunch Profile and Slice Emittance Diagnostics at the European XFEL”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 153-156. |
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S. Mattiello, A. Penirschke, and H. Schlarb, “Concept for the Minimization of the Electron Bunch Arrival-Time Jitter between Femtosecond Laser Pulses and Electron Bunches for Laser-Driven Plasma Wakefield Accelerators”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 157-160. |
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D. Malyutin, T. Atkinson, P. Goslawski, A. Jankowiak, A. N. Matveenko, and M. Ries, “Injection and Bunch Length Studies at the BESSY II Storage Ring”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 161-163. |
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S. Bielawski et al., “Improving the Sensitivity of Existing Electro-Optic Sampling Setups by Adding Brewster Plates: Tests of the Strategy at SOLEIL”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 164-167. |
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B. Xu, E. Carranza, A. Chen, S. Condamoor, W. J. Corbett, and A. S. Fisher, “Electron Bunch Pattern Monitoring via Single Photon Counting at SPEAR3”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 168-171. |
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J. Wang, D. Mihalcea, and P. Piot, “Time-Resolved Electron-Bunch Diagnostics Using Transverse Wakefields”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 172-175. |
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S. A. Gavrilov and A. Feschenko, “Bunch Shape Monitors for Modern Ion Linacs”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 176-178. |
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