JaCoW Logo

Reference Search

Reference


For Word

[n]	C. Gerth, B. Beutner, O. Hensler, F. Obier, M. Scholz, and M. Yan, “Online Longitudinal Bunch Profile and Slice Emittance Diagnostics at the European XFEL”, in Proc. IBIC'17, Grand Rapids, MI, USA, Aug. 2017, pp. 153-156. doi:10.18429/JACoW-IBIC2017-TUPCC03

For LaTeX

For BibTeX

Use Complete Form

Metadata

Paper Title: Online Longitudinal Bunch Profile and Slice Emittance Diagnostics at the European XFEL
Paper URL: https://jacow.org/ibic2017/papers/TUPCC03.pdf
Conference: 6th Int. Beam Instrumentation Conf. (IBIC'17)
Paper ID: TUPCC03
Location in proceedings: 153-156
Original Author String: C. Gerth, B. Beutner, O. Hensler, F. Obier, M. Scholz, M. Yan [DESY, Hamburg, Germany]

Associated Authors


Back to the list