7th Int. Beam Instrumentation Conf. (IBIC'18)
Shanghai, China, Sep. 2018
References
|
Reference
|
|
A. Potylitsyn, G. Kube, A. I. Novokshonov, and L. G. Sukhikh, “Spatial Resolution Improvement of OTR Monitors by Off-axis Light Collection”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 451-454. |
|
C. A. Thomas et al., “Design and Implementation of Non-Invasive Profile Monitors for the ESS LEBT”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 455-458. |
|
G. R. Coombs, M. Ferro-Luzzi, and R. Matev, “Beam-Gas Imaging Measurements at LHCb”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 459-463. |
|
S. Mazzoni et al., “Recent Results on Non-invasive Beam Size Measurement Methods Based on Polarization Currents”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 464-467. |
|
I. Ortega Ruiz et al., “A Multipurpose Scintillating Fibre Beam Monitor for the Measurement of Secondary Beams at CERN”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 468-471. |
|
R. Veness et al., “Development of a Beam-Gas Curtain Profile Monitor for the High Luminosity Upgrade of the LHC”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 472-476. |
|
L. Bobb and G. Rehm, “Performance of a Reflective Microscope Objective in an X-ray Pinhole Camera”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 477-481. |
|
B. G. Freeman, P. E. Evtushenko, J. Gubeli, and K. Jordan, “Experimental Setup of Apodization Techniques for Beam Diagnostics Performed at ELBE”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 482-485. |
|
C. Liu et al., “Transverse Beam Emittance Measurements with Multi-Slit and Moving-Slit Devices for LEReC”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 486-489. |
|
L. Adler et al., “Synchrotron Emittance Analysis Procedure at MedAustron”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 490-493. |
Back to the list