7th Int. Beam Instrumentation Conf. (IBIC'18)
Shanghai, China, Sep. 2018
References
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Reference
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J. Pforr et al., “Setup for Beam Profile Measurements using Optical Transition Radiation”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 494-497. |
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T. Lensch, S. Liu, and M. Scholz, “The European XFEL Wire Scanner System”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 498-500. |
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M. Veronese et al., “The New Diagnostic Suite for the Echo Enabled Harmonic Generation Experiment at FERMI”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 501-504. |
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S. V. Cao, M. L. Friend, M. Hartz, A. Nakamura, and K. Sakashita, “Optical System of Beam Induced Fluorescence Monitor Toward MW Beam Power at the J-PARC Neutrino Beamline”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 505-508. |
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M. W. Wang et al., “Design and Test Results of a Double-Slit Emittance Meter at XiPAF”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 509-511. |
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B. Gao, J. Chen, Y. B. Leng, and Y. M. Zhou, “Machine Learning Applied to Predict Transverse Oscillation at SSRF”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 512-515. |
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P. Tian, Q. S. Chen, K. Fan, J. Q. Li, and K. Tang, “Design and Radiation Simulation of the Scintillating Screen Detector for Proton Therapy Facility”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 516-518. |
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J. J. Ko et al., “X-ray Pinhole Camera in the Diagnostics Beamlime BL7B at PLS-II”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 519-522. |
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A. Mariet and R. Veness, “Selection of Wires for the New Generation of Fast Wire Scanners at CERN”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 523-526. |
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J. Marjanovic, “Low vs High Level Programming for FPGA”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 527-533. |
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