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7th Int. Beam Instrumentation Conf. (IBIC'18)

Shanghai, China, Sep. 2018

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	Reference
	M. V. Timoshenko et al., “Development of Longitudinal Beam Profile Diagnostics for Beam-beam Effects Study at VEPP-2000”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 410-414.
	J. Tan, G. Bellodi, A. Feschenko, and S. A. Gavrilov, “Results from the CERN LINAC4 Longitudinal Bunch Shape Monitor”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 415-419.
	V. R. Arsov et al., “First Results From the Bunch Arrival-Time Monitors at SwissFEL”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 420-424.
	M. Labat, J. Da Silva, N. Hubert, and F. Lepage, “Photon Beam Imager at SOLEIL”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 425-428.
	R. J. Yang et al., “Development of a a YAG/OTR Monitor”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 429-433.
	J. G. Hwang and J. Kuszynski, “First Prototype of a Coronagraph-based Halo Monitor for BERLinPro”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 434-437.
	R. Niemczyk et al., “Comparison of YAG Screens and LYSO Screens at PITZ”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 438-440.
	Q. Lin, W. J. Corbett, D. J. Martin, Z. H. Sun, and K. Tian, “Time-Synchronous Measurements of Transient Beam Dynamics at SPEAR3”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 441-444.
	G. Kim, H.-S. Kang, C. Kim, B. G. Oh, and D. C. Shin, “Wire Scanner Measurements at the PAL-XFEL”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 445-447.
	L. G. Sukhikh, G. Kube, A. Potylitsyn, S. A. Strokov, and K. Wittenburg, “Grating Scanner for Measurement of Micron-size Beam Profiles”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 448-450.

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