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N. Kuklev and Y. K. Kim, “Turn-by-Turn Synchrotron Radiation Transverse Profile Monitor for IOTA”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 432-435. |
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G. Andonian et al., “Fast and Robust Wire Scanners with Novel Materials for Profiling High Intensity Beams”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 436-438. |
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B. G. Freeman, J. Gubeli, and M. G. Tiefenback, “Multiple Synchrotron Light Monitors for Transverse Matching and Monitoring at CEBAF”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 439-443. |
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H. M. Xie et al., “Ionization Profile Monitor Design and Experiments in HIRFL-CSR”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 444-447. |
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A. F. D. Morgan, “Technological Review of Beam Position Button Design and Manufacture”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 448-452. |
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D. Lipka and B. Lorbeer, “Pile-Up Effect of Cold Button BPMs in the European XFEL Accelerator”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 453-456. |
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A. Arteche, S. E. Bashforth, A. Bosco, S. M. Gibson, M. Krupa, and T. Lef?¿vre, “Beam Measurements at the CERN SPS Using Interferometric Electro-Optic Pickups”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 457-460. |
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D. O. Tavares, G. B. M. Bruno, S. R. Marques, L. M. Russo, and H. A. Silva, “MicroTCA.4 at Sirius and a Closer Look into the Community”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 461-470. |
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H. Maesaka et al., “Development of MTCA.4-Based BPM Electronics for SPring-8 Upgrade”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 471-474. |
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J. H. Hanten, M. Arnold, J. Birkhan, C. Caliari, N. Pietralla, and M. Steinhorst, “Enhancement of the S-DALINAC Control System with Machine Learning Methods”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 475-478. |