9th Int. Beam Instrumentation Conf. (IBIC'20)
    
    
                    9th
                            International Beam Instrumentation Conference
                Santos, Brazil, Sep. 2020        
    
        
                                
                            Published Nov 2020
                        
                            
                    ISBN 978-3-95-450222-6
                            ISSN 2673-5350
                
    
            
    References 
            
    
    
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                C. L. Li, L. Feng, B. Liu, X. T. Wang, and W. Y. Zhang, “Photoinjector Driver Laser Temporal Shaping and Diagnostics for Shanghai Soft X-ray Free Electron Laser”, presented at the 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, paper WEPP25, unpublished. | 
                                
            
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                G. Loisch et al., “Measurement of CsÔééTe Cathode Response in a High-Gradient Photoinjector”, presented at the 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, paper THPP19, unpublished. | 
                                
            
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                K. J. Ruisard, A. V. Aleksandrov, and A. P. Shishlo, “Virtual Slit for Improved Resolution in Longitudinal Emittance Measurement”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 241-245. | 
                                
            
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                A. Sharma, R. K. Gangwar, and B. K. Sahu, “Design and Development of a Novel Stripline Fast Faraday Cup to Measure Ion Beam Profile”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 246-249. | 
                                
            
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                Y. Song and K. Fan, “A THz-Driven Split Ring Resonator for Temporal Characterization of Femtosecond MeV Electron Beam”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 250-253. | 
                                
            
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                A. Tipper, M. G. Abbott, and G. Rehm, “Tracking Frequency Reference Phase Changes at Point of Use Based on BPM Measurements”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 254-257. | 
                                
            
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                J. R. Calvey et al., “Measurements of Ion Instability and Emittance Growth for the APS-Upgrade”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 258-262. | 
                                
            
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                M. Huck, J. Bahrdt, H. Huck, A. Meseck, and M. Ries, “Transverse Broad-band Impedance Studies of the New In-vacuum Cryogenic Undulator at Bessy II Storage Ring”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 263-267. | 
                                
            
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                X. Yang, F. Z. Chen, and L. W. Lai, “Application of Wavelet Algorithm in Tune Measurement”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 268-271. | 
                                
            
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                J. H. Yue et al., “Consideration and Design of HEPS Beam Instrumentation”, presented at the 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, paper THPP31, unpublished. | 
                                
        
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