JaCoW Logo

Reference Search

9th Int. Beam Instrumentation Conf. (IBIC'20)

9th International Beam Instrumentation Conference
Santos, Brazil, Sep. 2020

Published Nov 2020
ISBN 978-3-95-450222-6
ISSN 2673-5350


References


Reference
J. He and J. H. Yue, “Bunch Purity Measurement and Improvement”, presented at the 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, paper TUPP01, unpublished.
J. L. Sun et al., “Commissioning of the Beam Instrumentation System of CSNS”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 7-10.
J. M. Weber, J. C. Bell, M. J. Chin, W. E. Norum, and G. J. Portmann, “Advanced Light Source High Speed Digitizer”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 132-135.
J. R. Calvey et al., “Measurements of Ion Instability and Emittance Growth for the APS-Upgrade”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 258-262.
J. Wan et al., “Prototype Design of Wire Scanner for SHINE”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 285-287.
K. J. Ruisard, A. V. Aleksandrov, and A. P. Shishlo, “Virtual Slit for Improved Resolution in Longitudinal Emittance Measurement”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 241-245.
K. P. Wootton et al., “Streak Camera Measurement of Electron Beam Energy Loss Per Turn in the Advanced Photon Source Particle Accumulator Ring”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 66-69.
K. P. Wootton, H. Cease, M. Erdmann, S. M. Oprondek, M. Ramanathan, and B. X. Yang, “X-Ray Beam Position Monitor Silicon Photodiode Measurements for the Advanced Photon Source Upgrade”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 46-50.
K. P. Wootton, W. X. Cheng, G. Decker, S. H. Lee, and B. X. Yang, “X-Ray Beam Size Monitor Enclosure for the Advanced Photon Source Upgrade”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 34-36.
L. Grech et al., “An Alternative Processing Algorithm for the Tune Measurement System in the LHC”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 162-165.

Back to the list