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[n]	J. Wan et al., “Prototype Design of Wire Scanner for SHINE”, in Proc. IBIC'20, Santos, Brazil, Sep. 2020, pp. 285-287. doi:10.18429/JACoW-IBIC2020-THPP36

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Paper Title: Prototype Design of Wire Scanner for SHINE
Paper URL: http://accelconf.web.cern.ch/ibic2020/papers/THPP36.pdf
Conference: 9th Int. Beam Instrumentation Conf. (IBIC'20)
Paper ID: THPP36
Location in proceedings: 285-287
Original Author String: J. Wan,F. Z. Chen,J. Chen,B. Gao,Y. B. Leng,K. R. Ye,L. Y. Yu,W. M. Zhou

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