24th International Workshop on ECR Ion Sources (ECRIS'20)
International Workshop on ECR Ion Sources # series
East Lansing, MI, USA, Sep. 2020
Published Jul 2022
ISBN 978-3-95-450226-4
ISSN 2222-5692
References
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Reference
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I. Izotov, A. Bokhanov, E. M. Kiseleva, R. L. Lapin, V. Skalyga, and S. S. Vybin, “GISMO Gasdynamic ECR Ion Source Status: Towards High-Intensity Ion Beams of Superior Quality”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper MOWZO04, pp. 13-16. |
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I. Owada et al., “Precise Identification of Extracted Ion Beam Spectrum Initially Obtained in Synthesising Iron-Endohedral Fullerenes on ECRIS”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper WEWZO02, pp. 114-117. |
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J. A. Adegun, F. Ames, and O. K. Kester, “Improvement of the Efficiency of the TRIUMF Charge State Booster (CSB)”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper WEZZO04, pp. 160-163. |
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J. A. Méndez, T. Minea, and T. Thuillier, “A Guiding Centre Approximation Approach for Simulation Electron Trajectories in ECR and Microwave Ion Sources”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper TUYZO02, pp. 84-89. |
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J. Angot et al., “Contaminants Reduction in ECR Charge Breeders by LNL LPSC GANIL Collaboration”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper WEZZO02, pp. 151-156. |
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J. B. Li et al., “Influences of Magnetic Field Parameters to ECRIS Plasma Characteristics”, presented at the 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper TUWZO04, unpublished. |
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J. W. Guo et al., “Tentative Solution to Plasma Chamber Cooling for High Power ECR Ion Source Operation”, presented at the 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper TUWZO02, unpublished. |
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K. Sato et al., “Beam Profile Measurements of Decelerated Multicharged Xe Ions from ECRIS for Estimating Low Energy Damage on Satellites Components”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper WEWZO05, pp. 125-127. |
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L. Celona et al., “Status of the AISHa Ion Source at INFN-LNS”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper MOWZO03, pp. 10-12. |
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L. E. Henderson, H. L. Clark, C. A. Gagliardi, and D. P. May, “Electron Cyclotron Emission Imaging of Electron Cyclotron Resonance Ion Source Plasmas”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper WEZZO10, pp. 164-166. |
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