[n] K. Sato et al., “Beam Profile Measurements of Decelerated Multicharged Xe Ions from ECRIS for Estimating Low Energy Damage on Satellites Components”, in Proc. ECRIS'20, East Lansing, MI, USA, Sep. 2020, pp. 125-127. doi:10.18429/JACoW-ECRIS2020-WEWZO05
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Paper Title: Beam Profile Measurements of Decelerated Multicharged Xe Ions from ECRIS for Estimating Low Energy Damage on Satellites Components
Paper URL: https://jacow.org/ecris2020/papers/wewzo05.pdf
Conference: 24th International Workshop on ECR Ion Sources (ECRIS'20)
Paper ID: WEWZO05
Location in proceedings: 125-127
Original Author String: K. Sato,S. Harisaki,Y. Kato,W. Kubo,K. Okumura,I. Owada,K. Tsuda