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[n]	P. R. Cameron, M. C. Grau, M. Morvillo, T. J. Shea, and R. E. Sikora, “RHIC Beam Position Monitor Characterization”, in Proc. PAC'95, Dallas, TX, USA, May 1995, paper MPQ05, pp. 2458-2460. 

[n]	G. M. Ge et al., “Surface Topography Techniques at Cornell University: Optical Inspection and Surface Replica”, in Proc. IPAC'16, Busan, Korea, May 2016, pp. 2292-2294. doi:10.18429/JACoW-IPAC2016-WEPMR015

For LaTeX

%\cite{Cameron:PAC95-MPQ05} \bibitem{Cameron:PAC95-MPQ05} P. R. Cameron, M. C. Grau, M. Morvillo, T. J. Shea, and R. E. Sikora, \textquotedblleft{RHIC Beam Position Monitor Characterization}\textquotedblright, in \emph{Proc. PAC’95}, Dallas, TX, USA, May 1995, paper MPQ05, pp. 2458--2460. %\cite{Ge:IPAC16-WEPMR015} \bibitem{Ge:IPAC16-WEPMR015} G. M. Ge \emph{et al.}, \textquotedblleft{Surface Topography Techniques at Cornell University: Optical Inspection and Surface Replica}\textquotedblright, in \emph{Proc. IPAC’16}, Busan, Korea, May 2016, pp. 2292--2294. \doi{10.18429/JACoW-IPAC2016-WEPMR015}

For BibTeX

@inproceedings{cameron:pac95-mpq05, author = {P. R. Cameron and M. C. Grau and M. Morvillo and T. J. Shea and R. E. Sikora}, title = {{RHIC Beam Position Monitor Characterization}}, booktitle = {Proc. PAC'95}, pages = {2458--2460}, paper = {MPQ05}, venue = {Dallas, TX, USA, May 1995}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} } @inproceedings{ge:ipac16-wepmr015, author = {G. M. Ge and others}, title = {{Surface Topography Techniques at Cornell University: Optical Inspection and Surface Replica}}, booktitle = {Proc. IPAC'16}, pages = {2292--2294}, paper = {WEPMR015}, venue = {Busan, Korea}, series = {International Particle Accelerator Conference}, number = {7}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {6}, year = {2016}, doi = {10.18429/JACoW-IPAC2016-WEPMR015}, url = {https://jacow.org/ipac2016/papers/WEPMR015.pdf}, language = {english} }

References

• P. R. Cameron, M. C. Grau, M. Morvillo, T. J. Shea, and R. E. Sikora, “RHIC Beam Position Monitor Characterization”, in Proc. 16th Particle Accelerator Conf. (PAC'95), Dallas, TX, USA, May 1995, paper MPQ05, pp. 2458-2460.
• G. M. Ge et al., “Surface Topography Techniques at Cornell University: Optical Inspection and Surface Replica”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 2292-2294.