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[n]	J. B. Johnson, “PIN Diode Detectors at DARHT II”, in Proc. NAPAC'13, Pasadena, CA, USA, Sep.-Oct. 2013, paper THPAC24, pp. 1193-1195. 

[n]	S. Bou Habib, A. Abramowicz, N. Baboi, and H. Schlarb, “New Design of High Order Modes Electronics in MTCA.4 Standard for FLASH and the European XFEL”, in Proc. IBIC'13, Oxford, UK, Sep. 2013, paper TUPC31, pp. 443-446. 

[n]	E. A. Nissen, J. R. Delayen, and G. A. Krafft, “A Proposed Beam-Beam Test Facility COMBINE”, in Proc. IPAC'21, Campinas, Brazil, May 2021, pp. 3802-3804. doi:10.18429/JACoW-IPAC2021-THPAB025

For LaTeX

%\cite{Johnson:NAPAC13-THPAC24} \bibitem{Johnson:NAPAC13-THPAC24} J. B. Johnson, \textquotedblleft{PIN Diode Detectors at DARHT II}\textquotedblright, in \emph{Proc. NAPAC’13}, Pasadena, CA, USA, Sep.-Oct. 2013, paper THPAC24, pp. 1193--1195. %\cite{Bou Habib:IBIC13-TUPC31} \bibitem{Bou Habib:IBIC13-TUPC31} S. Bou Habib, A. Abramowicz, N. Baboi, and H. Schlarb, \textquotedblleft{New Design of High Order Modes Electronics in MTCA.4 Standard for FLASH and the European XFEL}\textquotedblright, in \emph{Proc. IBIC’13}, Oxford, UK, Sep. 2013, paper TUPC31, pp. 443--446. %\cite{Nissen:IPAC21-THPAB025} \bibitem{Nissen:IPAC21-THPAB025} E. A. Nissen, J. R. Delayen, and G. A. Krafft, \textquotedblleft{A Proposed Beam-Beam Test Facility COMBINE}\textquotedblright, in \emph{Proc. IPAC’21}, Campinas, Brazil, May 2021, pp. 3802--3804. \doi{10.18429/JACoW-IPAC2021-THPAB025}

For BibTeX

@inproceedings{johnson:napac13-thpac24, author = {J. B. Johnson}, title = {{PIN Diode Detectors at DARHT II}}, booktitle = {Proc. NAPAC'13}, pages = {1193--1195}, paper = {THPAC24}, venue = {Pasadena, CA, USA, Sep.-Oct. 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/PAC2013/papers/THPAC24.pdf}, language = {english} } @inproceedings{bou habib:ibic13-tupc31, author = {S. Bou Habib and A. Abramowicz and N. Baboi and H. Schlarb}, title = {{New Design of High Order Modes Electronics in MTCA.4 Standard for FLASH and the European XFEL}}, booktitle = {Proc. IBIC'13}, pages = {443--446}, paper = {TUPC31}, venue = {Oxford, UK, Sep. 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IBIC2013/papers/TUPC31.pdf}, language = {english} } @inproceedings{nissen:ipac21-thpab025, author = {E. A. Nissen and J. R. Delayen and G. A. Krafft}, title = {{A Proposed Beam-Beam Test Facility COMBINE}}, booktitle = {Proc. IPAC'21}, pages = {3802--3804}, paper = {THPAB025}, venue = {Campinas, Brazil, May 2021}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IPAC2021-THPAB025}, url = {https://jacow.org/ipac2021/papers/THPAB025.pdf}, language = {english} }

References

• J. B. Johnson, “PIN Diode Detectors at DARHT II”, in Proc. North American Particle Accelerator Conf. (NAPAC'13), Pasadena, CA, USA, Sep.-Oct. 2013, paper THPAC24, pp. 1193-1195.
• S. Bou Habib, A. Abramowicz, N. Baboi, and H. Schlarb, “New Design of High Order Modes Electronics in MTCA.4 Standard for FLASH and the European XFEL”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper TUPC31, pp. 443-446.
• E. A. Nissen, J. R. Delayen, and G. A. Krafft, “A Proposed Beam-Beam Test Facility COMBINE”, in Proc. 12th Int. Particle Accelerator Conf. (IPAC'21), Campinas, Brazil, May 2021, pp. 3802-3804.