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[n]	W. Fang, Q. Gu, Z. T. Zhao, and D. C. Tong, “The High Power Test Model of C-band Accelerating Structure for Compact XFEL at SINAP”, in Proc. FEL'11, Shanghai, China, Aug. 2011, paper THPB28, pp. 617-620. 

[n]	M. E. Schneider et al., “FEbreak: A Comprehensive Diagnostic and Automated Conditioning Interface for Analysis of Breakdown and Dark Current Effects”, in Proc. IPAC'21, Campinas, Brazil, May 2021, pp. 4027-4029. doi:10.18429/JACoW-IPAC2021-THPAB138

For LaTeX

%\cite{Fang:FEL11-THPB28} \bibitem{Fang:FEL11-THPB28} W. Fang, Q. Gu, Z. T. Zhao, and D. C. Tong, \textquotedblleft{The High Power Test Model of C-band Accelerating Structure for Compact XFEL at SINAP}\textquotedblright, in \emph{Proc. FEL’11}, Shanghai, China, Aug. 2011, paper THPB28, pp. 617--620. %\cite{Schneider:IPAC21-THPAB138} \bibitem{Schneider:IPAC21-THPAB138} M. E. Schneider \emph{et al.}, \textquotedblleft{FEbreak: A Comprehensive Diagnostic and Automated Conditioning Interface for Analysis of Breakdown and Dark Current Effects}\textquotedblright, in \emph{Proc. IPAC’21}, Campinas, Brazil, May 2021, pp. 4027--4029. \url{doi:10.18429/JACoW-IPAC2021-THPAB138}

For BibTeX

@inproceedings{fang:fel11-thpb28, author = {W. Fang and Q. Gu and Z. T. Zhao and D. C. Tong}, title = {{The High Power Test Model of C-band Accelerating Structure for Compact XFEL at SINAP}}, booktitle = {Proc. FEL'11}, pages = {617--620}, paper = {THPB28}, venue = {Shanghai, China, Aug. 2011}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/FEL2011/papers/THPB28.pdf}, language = {english} } @inproceedings{schneider:ipac21-thpab138, author = {M. E. Schneider and others}, title = {{FEbreak: A Comprehensive Diagnostic and Automated Conditioning Interface for Analysis of Breakdown and Dark Current Effects}}, booktitle = {Proc. IPAC'21}, pages = {4027--4029}, paper = {THPAB138}, venue = {Campinas, Brazil, May 2021}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IPAC2021-THPAB138}, url = {https://jacow.org/ipac2021/papers/THPAB138.pdf}, language = {english} }

References

• W. Fang, Q. Gu, Z. T. Zhao, and D. C. Tong, “The High Power Test Model of C-band Accelerating Structure for Compact XFEL at SINAP”, in Proc. 33rd Int. Free Electron Laser Conf. (FEL'11), Shanghai, China, Aug. 2011, paper THPB28, pp. 617-620.
• M. E. Schneider et al., “FEbreak: A Comprehensive Diagnostic and Automated Conditioning Interface for Analysis of Breakdown and Dark Current Effects”, in Proc. 12th Int. Particle Accelerator Conf. (IPAC'21), Campinas, Brazil, May 2021, pp. 4027-4029.