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[n] X. Wang, “Megaelectron-Volt ultrafast electron microscope – the future of electron imaging”, presented at the IPAC'23, Venice, Italy, May 2023, paper TUODC1, unpublished.
[n] F. Neri and R. L. Gluckstern, “Single Bunch Cumulative Beam Breakup”, in Proc. PAC'89, Chicago, IL, USA, Mar. 1989, pp. 812-815.
[n] V. G. Ziemann et al., “Technical Aspects of the Integration of the Optical Replica Synthesizer for the Diagnostics of Ultra-short Bunches in FLASH at DESY”, in Proc. EPAC'06, Edinburgh, UK, Jun. 2006, paper TUPCH081, pp. 1199-1201.
[n] N. Kumar, A. Salehilashkajani, C. P. Welsch, and H. D. Zhang, “Quantum Gas Jet Scanner Based Beam Profile Monitors”, in Proc. IPAC'21, Campinas, Brazil, May 2021, pp. 2128-2131. doi:10.18429/JACoW-IPAC2021-TUPAB280
[n] N. Kumar, A. Salehilashkajani, C. P. Welsch, and H. D. Zhang, “Gas-Mixing to Improve the Resolution of Non-Invasive Gas Jet-Based Ionization Profile Monitors”, in Proc. IPAC'21, Campinas, Brazil, May 2021, pp. 2132-2135. doi:10.18429/JACoW-IPAC2021-TUPAB281
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References
- X. Wang, “Megaelectron-Volt ultrafast electron microscope – the future of electron imaging”, presented at the 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper TUODC1, unpublished.
- F. Neri and R. L. Gluckstern, “Single Bunch Cumulative Beam Breakup”, in Proc. 13th Particle Accelerator Conf. (PAC'89), Chicago, IL, USA, Mar. 1989, pp. 812-815.
- V. G. Ziemann et al., “Technical Aspects of the Integration of the Optical Replica Synthesizer for the Diagnostics of Ultra-short Bunches in FLASH at DESY”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper TUPCH081, pp. 1199-1201.
- N. Kumar, A. Salehilashkajani, C. P. Welsch, and H. D. Zhang, “Quantum Gas Jet Scanner Based Beam Profile Monitors”, in Proc. 12th Int. Particle Accelerator Conf. (IPAC'21), Campinas, Brazil, May 2021, pp. 2128-2131.
- N. Kumar, A. Salehilashkajani, C. P. Welsch, and H. D. Zhang, “Gas-Mixing to Improve the Resolution of Non-Invasive Gas Jet-Based Ionization Profile Monitors”, in Proc. 12th Int. Particle Accelerator Conf. (IPAC'21), Campinas, Brazil, May 2021, pp. 2132-2135.
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