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[n] F. Sannibale, “Overview of Electron Source Development for High Repetition Rate FEL Facilities”, in Proc. NAPAC'16, Chicago, IL, USA, Oct. 2016, pp. 445-449. doi:10.18429/JACoW-NAPAC2016-TUB3IO02
[n] A. Seidel and J. Osterhoff, “Characterizing Ultralow Emittance Electron Beams using Structured Light Fields”, presented at the IBIC'21, Pohang, Korea, Sep. 2021, paper TUOA02, unpublished.
[n] S. Rosily, S. Krishnagopal, and S. Singh, “Electronics for Bead-pull Measurement of Radio Frequency Accelerating Structures in LEHIPA”, in Proc. IPAC'21, Campinas, Brazil, May 2021, pp. 993-995. doi:10.18429/JACoW-IPAC2021-MOPAB322
[n] J. L. Steinmann et al., “Increasing the Single-Bunch Instability Threshold by Bunch Splitting Due to RF Phase Modulation”, in Proc. IPAC'21, Campinas, Brazil, May 2021, pp. 3193-3196. doi:10.18429/JACoW-IPAC2021-WEPAB240
[n] J. W. Angle, G. V. Eremeev, M. J. Kelley, U. Pudasaini, C. E. Reece, and J. Tuggle, “Crystallographic Characterization of Nb?Sn Coatings and N-Doped Niobium via EBSD and SIMS”, in Proc. SRF'19, Dresden, Germany, Jun.-Jul. 2019, pp. 871-875. doi:10.18429/JACoW-SRF2019-THP017
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References
- F. Sannibale, “Overview of Electron Source Development for High Repetition Rate FEL Facilities”, in Proc. North American Particle Accelerator Conf. (NAPAC'16), Chicago, IL, USA, Oct. 2016, pp. 445-449.
- A. Seidel and J. Osterhoff, “Characterizing Ultralow Emittance Electron Beams using Structured Light Fields”, presented at the 10th Int. Beam Instrumentation Conf. (IBIC'21), Pohang, Korea, Sep. 2021, paper TUOA02, unpublished.
- S. Rosily, S. Krishnagopal, and S. Singh, “Electronics for Bead-pull Measurement of Radio Frequency Accelerating Structures in LEHIPA”, in Proc. 12th Int. Particle Accelerator Conf. (IPAC'21), Campinas, Brazil, May 2021, pp. 993-995.
- J. L. Steinmann et al., “Increasing the Single-Bunch Instability Threshold by Bunch Splitting Due to RF Phase Modulation”, in Proc. 12th Int. Particle Accelerator Conf. (IPAC'21), Campinas, Brazil, May 2021, pp. 3193-3196.
- J. W. Angle, G. V. Eremeev, M. J. Kelley, U. Pudasaini, C. E. Reece, and J. Tuggle, “Crystallographic Characterization of Nb?Sn Coatings and N-Doped Niobium via EBSD and SIMS”, in Proc. 19th Int. Conf. RF Superconductivity (SRF'19), Dresden, Germany, Jun.-Jul. 2019, pp. 871-875.
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