[n] S. Bielawski, C. Gerth, B. Steffen, C. Evain, E. Roussel, and C. Szwaj, “A New Scheme for Recording Electron Bunch Shapes with High Resolution and Record Recording Length: Principle and Tests at European XFEL”, in Proc. IPAC'20, Caen, France, May 2020, paper WEVIR14, pp. XX-XX.
Use Complete Form