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[n]	M. Fouaidy, B. Aune, R. Brizzi, J. Gratadour, M. Juillard, and T. Junquera, “Thermal Model Calculations in Superconducting RF Cavities”, in Proc. EPAC'92, Berlin, Germany, Mar. 1992, pp. 1304-1307. 

[n]	J. E. Lerch, T. J. Bender, O. K. Mulvany, and M. E. Szubert, “APS Upgrade Insertion Device Vacuum Chamber Design”, in Proc. NAPAC'19, Lansing, MI, USA, Sep. 2019, pp. 450-452. doi:10.18429/JACoW-NAPAC2019-TUPLS02

[n]	C. Ozkan Loch, R. Ischebeck, and A. M. M. Stampfli, “CMOS Based Beam Loss Monitor at the SLS”, in Proc. IBIC'21, Pohang, Korea, Sep. 2021, pp. 186-188. doi:10.18429/JACoW-IBIC2021-TUOB02

[n]	I. Lobach et al., “Transverse Beam Emittance Measurement by Undulator Radiation Power Noise”, in Proc. IBIC'21, Pohang, Korea, Sep. 2021, pp. 167-167. doi:10.18429/JACoW-IBIC2021-TUOA03

[n]	T. Yang et al., “Studies of Beam Loss Monitors at the China Spallation Neutron Source”, in Proc. IBIC'21, Pohang, Korea, Sep. 2021, pp. 180-185. doi:10.18429/JACoW-IBIC2021-TUOB01

For LaTeX

%\cite{Fouaidy:EPAC92} \bibitem{Fouaidy:EPAC92} M. Fouaidy, B. Aune, R. Brizzi, J. Gratadour, M. Juillard, and T. Junquera, \textquotedblleft{Thermal Model Calculations in Superconducting RF Cavities}\textquotedblright, in \emph{Proc. EPAC’92}, Berlin, Germany, Mar. 1992, pp. 1304--1307. %\cite{Lerch:NAPAC19-TUPLS02} \bibitem{Lerch:NAPAC19-TUPLS02} J. E. Lerch, T. J. Bender, O. K. Mulvany, and M. E. Szubert, \textquotedblleft{APS Upgrade Insertion Device Vacuum Chamber Design}\textquotedblright, in \emph{Proc. NAPAC’19}, Lansing, MI, USA, Sep. 2019, pp. 450--452. \doi{10.18429/JACoW-NAPAC2019-TUPLS02} %\cite{Ozkan Loch:IBIC21-TUOB02} \bibitem{Ozkan Loch:IBIC21-TUOB02} C. Ozkan Loch, R. Ischebeck, and A. M. M. Stampfli, \textquotedblleft{CMOS Based Beam Loss Monitor at the SLS}\textquotedblright, in \emph{Proc. IBIC’21}, Pohang, Korea, Sep. 2021, pp. 186--188. \doi{10.18429/JACoW-IBIC2021-TUOB02} %\cite{Lobach:IBIC21-TUOA03} \bibitem{Lobach:IBIC21-TUOA03} I. Lobach \emph{et al.}, \textquotedblleft{Transverse Beam Emittance Measurement by Undulator Radiation Power Noise}\textquotedblright, in \emph{Proc. IBIC’21}, Pohang, Korea, Sep. 2021, pp. 167--167. \doi{10.18429/JACoW-IBIC2021-TUOA03} %\cite{Yang:IBIC21-TUOB01} \bibitem{Yang:IBIC21-TUOB01} T. Yang \emph{et al.}, \textquotedblleft{Studies of Beam Loss Monitors at the China Spallation Neutron Source}\textquotedblright, in \emph{Proc. IBIC’21}, Pohang, Korea, Sep. 2021, pp. 180--185. \doi{10.18429/JACoW-IBIC2021-TUOB01}

For BibTeX

@inproceedings{fouaidy:epac92, author = {M. Fouaidy and B. Aune and R. Brizzi and J. Gratadour and M. Juillard and T. Junquera}, title = {{Thermal Model Calculations in Superconducting RF Cavities}}, booktitle = {Proc. EPAC'92}, pages = {1304--1307}, paper = {}, venue = {Berlin, Germany, Mar. 1992}, series = {European Particle Accelerator Conference}, number = {3}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} } @inproceedings{lerch:napac19-tupls02, author = {J. E. Lerch and T. J. Bender and O. K. Mulvany and M. E. Szubert}, title = {{APS Upgrade Insertion Device Vacuum Chamber Design}}, booktitle = {Proc. NAPAC'19}, pages = {450--452}, paper = {TUPLS02}, venue = {Lansing, MI, USA, Sep. 2019}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-NAPAC2019-TUPLS02}, url = {https://jacow.org/napac2019/papers/TUPLS02.pdf}, language = {english} } @inproceedings{ozkan loch:ibic21-tuob02, author = {C. Ozkan Loch and R. Ischebeck and A. M. M. Stampfli}, title = {{CMOS Based Beam Loss Monitor at the SLS}}, booktitle = {Proc. IBIC'21}, pages = {186--188}, paper = {TUOB02}, venue = {Pohang, Korea}, series = {International Beam Instrumentation Conference}, number = {10}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2021}, issn = {2673-5350}, isbn = {978-3-95-450230-1}, doi = {10.18429/JACoW-IBIC2021-TUOB02}, url = {https://jacow.org/ibic2021/papers/TUOB02.pdf}, language = {english} } @inproceedings{lobach:ibic21-tuoa03, author = {I. Lobach and others}, title = {{Transverse Beam Emittance Measurement by Undulator Radiation Power Noise}}, booktitle = {Proc. IBIC'21}, pages = {167--167}, paper = {TUOA03}, venue = {Pohang, Korea}, series = {International Beam Instrumentation Conference}, number = {10}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2021}, issn = {2673-5350}, isbn = {978-3-95-450230-1}, doi = {10.18429/JACoW-IBIC2021-TUOA03}, url = {https://jacow.org/ibic2021/papers/TUOA03.pdf}, language = {english} } @inproceedings{yang:ibic21-tuob01, author = {T. Yang and others}, title = {{Studies of Beam Loss Monitors at the China Spallation Neutron Source}}, booktitle = {Proc. IBIC'21}, pages = {180--185}, paper = {TUOB01}, venue = {Pohang, Korea}, series = {International Beam Instrumentation Conference}, number = {10}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2021}, issn = {2673-5350}, isbn = {978-3-95-450230-1}, doi = {10.18429/JACoW-IBIC2021-TUOB01}, url = {https://jacow.org/ibic2021/papers/TUOB01.pdf}, language = {english} }

References

• M. Fouaidy, B. Aune, R. Brizzi, J. Gratadour, M. Juillard, and T. Junquera, “Thermal Model Calculations in Superconducting RF Cavities”, in Proc. 3rd European Particle Accelerator Conf. (EPAC'92), Berlin, Germany, Mar. 1992, pp. 1304-1307.
• J. E. Lerch, T. J. Bender, O. K. Mulvany, and M. E. Szubert, “APS Upgrade Insertion Device Vacuum Chamber Design”, in Proc. North American Particle Accelerator Conf. (NAPAC'19), Lansing, MI, USA, Sep. 2019, pp. 450-452.
• C. Ozkan Loch, R. Ischebeck, and A. M. M. Stampfli, “CMOS Based Beam Loss Monitor at the SLS”, in Proc. 10th Int. Beam Instrumentation Conf. (IBIC'21), Pohang, Korea, Sep. 2021, pp. 186-188.
• I. Lobach et al., “Transverse Beam Emittance Measurement by Undulator Radiation Power Noise”, in Proc. 10th Int. Beam Instrumentation Conf. (IBIC'21), Pohang, Korea, Sep. 2021, pp. 167-167.
• T. Yang et al., “Studies of Beam Loss Monitors at the China Spallation Neutron Source”, in Proc. 10th Int. Beam Instrumentation Conf. (IBIC'21), Pohang, Korea, Sep. 2021, pp. 180-185.