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[n]	V. V. Konovalov, S. Bellavia, J. C. Brutus, R. J. Michnoff, T. A. Miller, and P. Thieberger, “Fast Scanning Diamond Detector for Electron Beam Profile Monitoring”, in Proc. IBIC'21, Pohang, Korea, Sep. 2021, pp. 276-280. doi:10.18429/JACoW-IBIC2021-TUPP30

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