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[n]	M. G. Giacchini, C. S. Derrez, J. P. S. Martins, M. Montis, and R. Tarkeshian, “EPICS Based High-Level Control System for ESS-ERIC Emittance Measurement Unit Device”, in Proc. ICALEPCS'21, Shanghai, China, Oct. 2021, pp. 423-427. doi:10.18429/JACoW-ICALEPCS2021-TUPV015

[n]	M. Killenberg et al., “Automated Device Error Handling in Control Applications”, in Proc. ICALEPCS'21, Shanghai, China, Oct. 2021, pp. 408-412. doi:10.18429/JACoW-ICALEPCS2021-TUPV012

For LaTeX

%\cite{Giacchini:ICALEPCS21-TUPV015} \bibitem{Giacchini:ICALEPCS21-TUPV015} M. G. Giacchini, C. S. Derrez, J. P. S. Martins, M. Montis, and R. Tarkeshian, \textquotedblleft{EPICS Based High-Level Control System for ESS-ERIC Emittance Measurement Unit Device}\textquotedblright, in \emph{Proc. ICALEPCS’21}, Shanghai, China, Oct. 2021, pp. 423--427. \doi{10.18429/JACoW-ICALEPCS2021-TUPV015} %\cite{Killenberg:ICALEPCS21-TUPV012} \bibitem{Killenberg:ICALEPCS21-TUPV012} M. Killenberg \emph{et al.}, \textquotedblleft{Automated Device Error Handling in Control Applications}\textquotedblright, in \emph{Proc. ICALEPCS’21}, Shanghai, China, Oct. 2021, pp. 408--412. \doi{10.18429/JACoW-ICALEPCS2021-TUPV012}

For BibTeX

@inproceedings{giacchini:icalepcs21-tupv015, author = {M. G. Giacchini and C. S. Derrez and J. P. S. Martins and M. Montis and R. Tarkeshian}, title = {{EPICS Based High-Level Control System for ESS-ERIC Emittance Measurement Unit Device}}, booktitle = {Proc. ICALEPCS'21}, pages = {423--427}, paper = {TUPV015}, venue = {Shanghai, China}, series = {International Conference on Accelerator and Large Experimental Physics Control Systems}, number = {18}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {2}, year = {2022}, issn = {2226-0358}, isbn = {978-3-95-450221-9}, doi = {10.18429/JACoW-ICALEPCS2021-TUPV015}, url = {https://jacow.org/icalepcs2021/papers/TUPV015.pdf}, language = {english} } @inproceedings{killenberg:icalepcs21-tupv012, author = {M. Killenberg and others}, title = {{Automated Device Error Handling in Control Applications}}, booktitle = {Proc. ICALEPCS'21}, pages = {408--412}, paper = {TUPV012}, venue = {Shanghai, China}, series = {International Conference on Accelerator and Large Experimental Physics Control Systems}, number = {18}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {2}, year = {2022}, issn = {2226-0358}, isbn = {978-3-95-450221-9}, doi = {10.18429/JACoW-ICALEPCS2021-TUPV012}, url = {https://jacow.org/icalepcs2021/papers/TUPV012.pdf}, language = {english} }

References

• M. G. Giacchini, C. S. Derrez, J. P. S. Martins, M. Montis, and R. Tarkeshian, “EPICS Based High-Level Control System for ESS-ERIC Emittance Measurement Unit Device”, in Proc. 18th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'21), Shanghai, China, Oct. 2021, pp. 423-427.
• M. Killenberg et al., “Automated Device Error Handling in Control Applications”, in Proc. 18th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'21), Shanghai, China, Oct. 2021, pp. 408-412.