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[n]	G. Mitsuka, K. Mori, and M. Tobiyama, “Betatron Phase Advance Measurements Using the Gated Turn-by-turn Monitors at SuperKEKB”, in Proc. IBIC'19, Malmö, Sweden, Sep. 2019, pp. 591-594. doi:10.18429/JACoW-IBIC2019-WEPP030

[n]	P. Moschovakos, P. P. Nikiel, and S. Schlenker, “OPC UA Controls for ATCA Back-End Electronics”, presented at the ICALEPCS'21, Shanghai, China, Oct. 2021, paper TUPV038, unpublished. 

[n]	G. Kube et al., “Transverse Beam Profile Imaging of Few-Micrometer Beam Sizes Based on a Scintillator Screen”, in Proc. IBIC'15, Melbourne, Australia, Sep. 2015, pp. 330-334. doi:10.18429/JACoW-IBIC2015-TUPB012

For LaTeX

%\cite{Mitsuka:IBIC19-WEPP030} \bibitem{Mitsuka:IBIC19-WEPP030} G. Mitsuka, K. Mori, and M. Tobiyama, \textquotedblleft{Betatron Phase Advance Measurements Using the Gated Turn-by-turn Monitors at SuperKEKB}\textquotedblright, in \emph{Proc. IBIC’19}, Malmö, Sweden, Sep. 2019, pp. 591--594. \doi{10.18429/JACoW-IBIC2019-WEPP030} %\cite{Moschovakos:ICALEPCS21-TUPV038} \bibitem{Moschovakos:ICALEPCS21-TUPV038} P. Moschovakos, P. P. Nikiel, and S. Schlenker, \textquotedblleft{OPC UA Controls for ATCA Back-End Electronics}\textquotedblright, presented at the ICALEPCS’21, Shanghai, China, Oct. 2021, paper TUPV038, unpublished. %\cite{Kube:IBIC15-TUPB012} \bibitem{Kube:IBIC15-TUPB012} G. Kube \emph{et al.}, \textquotedblleft{Transverse Beam Profile Imaging of Few-Micrometer Beam Sizes Based on a Scintillator Screen}\textquotedblright, in \emph{Proc. IBIC’15}, Melbourne, Australia, Sep. 2015, pp. 330--334. \doi{10.18429/JACoW-IBIC2015-TUPB012}

For BibTeX

@inproceedings{mitsuka:ibic19-wepp030, author = {G. Mitsuka and K. Mori and M. Tobiyama}, title = {{Betatron Phase Advance Measurements Using the Gated Turn-by-turn Monitors at SuperKEKB}}, booktitle = {Proc. IBIC'19}, pages = {591--594}, paper = {WEPP030}, venue = {Malmö, Sweden, Sep. 2019}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2019-WEPP030}, url = {https://jacow.org/ibic2019/papers/WEPP030.pdf}, language = {english} } @unpublished{moschovakos:icalepcs21-tupv038, author = {P. Moschovakos and P. P. Nikiel and S. Schlenker}, title = {{OPC UA Controls for ATCA Back-End Electronics}}, booktitle = {Proc. ICALEPCS'21}, pages = {}, paper = {TUPV038}, venue = {Shanghai, China}, intype = {presented at the}, series = {International Conference on Accelerator and Large Experimental Physics Control Systems}, number = {18}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {2}, year = {2022}, issn = {2226-0358}, isbn = {978-3-95-450221-9}, note = {presented at ICALEPCS'21, Shanghai, China, Oct. 2021, paper TUPV038, unpublished}, language = {english} } @inproceedings{kube:ibic15-tupb012, author = {G. Kube and others}, title = {{Transverse Beam Profile Imaging of Few-Micrometer Beam Sizes Based on a Scintillator Screen}}, booktitle = {Proc. IBIC'15}, pages = {330--334}, paper = {TUPB012}, venue = {Melbourne, Australia, Sep. 2015}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2015-TUPB012}, url = {https://jacow.org/IBIC2015/papers/TUPB012.pdf}, language = {english} }

References

• G. Mitsuka, K. Mori, and M. Tobiyama, “Betatron Phase Advance Measurements Using the Gated Turn-by-turn Monitors at SuperKEKB”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 591-594.
• P. Moschovakos, P. P. Nikiel, and S. Schlenker, “OPC UA Controls for ATCA Back-End Electronics”, presented at the 18th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'21), Shanghai, China, Oct. 2021, paper TUPV038, unpublished.
• G. Kube et al., “Transverse Beam Profile Imaging of Few-Micrometer Beam Sizes Based on a Scintillator Screen”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 330-334.